Atomic Force Microscope: AFM
SPA 400
Polarized Optical Microscope: POM
nikon MODEL ECLIPSE E-600FN
Field-Effect Scanning Electron Microscope: FE-SEM)
Electron beam writer, electron beam lithography
Scanning Probe Microscope: SPM
Surface Profiler, Film Thickness Measurement
Dektak 150
Focused Ion Beam: FIB
KMI-9200
Flash-Photolysis Time-Resolved Microwave Conductivity: FP-TRMC, Transient Absorption Sepectroscopy: TAS
Flash-Photolysis Time-Resolved Microwave Conductivity: FP-TRMC
Electron Spin Resonance: ESR, with time-resolved measurment
JES-FA200
ArF Excimer Laser
Photocurrent measurment, Time-of-Flight: TOF
Picosecond fluorescence lifetime spectroscopy
Microwave dielectric loss spectroscopy
Glovebox with spin-coater, sealer, heater
Thermal evaporator, connected to glove box
E-80
Glovebox with spin-coater, heater, weighter
Thermal evaporator and RF sputter, (connected to glove box
FET prober
Semiconductor Analyzer
KEITHLEY 4200-SCS/F
Solar Simulator
XES-301S+EL-100
Thermal evaporator and RF sputter
VX-2OH
UV/Ozone, spin-coater, vaccum oven
Photo Lithography
External Quantum Efficiency: EQE Spectrometer
SM-250KD
External Quantum Efficiency: EQE Spectrometer
IPCE-1500
SQUID
Cyclic Voltammetry: CV
BAS 100B
Ventilation x5
Differential Scanning Calorimetry: DSC
DSC6000ベースユニット, DSC6200Sセンサーユニット
Evaporator
N-1110V, N-1000V
Gel Permeation Chromatography: GPC
Nuclear Magnetic Resonance: NMR
High performance liquid chromatography: HPLC
LC-9210NEXT
Fourier Tranform Infrared Spectroscopy: FT-IR
Nexus470
UV-Vis-IR Absorption Spectroscopy
V-570 紫外可視近赤外分光光度計, ISN-470 光度計用積分球装置
Vacuum line
Fluorescence Spectroscopy
F-7200
Photoelectron Yield Spectroscopy: PYS